DocumentCode :
2043273
Title :
Positive working photosensitive polymers for semiconductor surface coating
Author :
Banba, T. ; Takeuchi, E. ; Tokoh, A. ; Takeda, T.
Author_Institution :
Sumitomo Bakelite Co. Ltd., Kanagawa, Japan
fYear :
1991
fDate :
11-16 May 1991
Firstpage :
564
Lastpage :
567
Abstract :
A positive working photosensitive polymer for semiconductor surface coating has been developed. Two types of thermal stable polymers, polyimide with hydroxyl groups and polybenzoxazole (PBO) precursor, were examined. It was confirmed that PBO precursor is superior to polyimide with hydroxyl groups with respect to solvent and humidity resistance. But PBO precursor had only poor adhesion to silicon wafers, and their patterns were stripped easily from substrates in developing with alkaline solution. The effect of the addition of silane coupling agents and the modification of PBO precursor with silicone compound in order to improve their adhesion properties is discussed. As a result, it was found that they had excellent adhesion to silicon wafer during development when they are modified with some silicone polyimides. Through these results, a positive working photosensitive polymer with practical sensitivity and resolution was developed
Keywords :
photoresists; polymer films; PBO precursor; Si substrates; adhesion promoter; adhesion properties; adhesion to Si wafers; humidity resistance; polybenzoxazole precursor; polyimide with hydroxyl groups; positive photoresists; positive working photosensitive polymer; resolution; semiconductor surface coating; sensitivity; silane coupling agents; silicone compound; thermal stable polymers; Adhesives; Circuits; Coatings; Conducting materials; Polyimides; Polymer films; Resists; Silicon; Solvents; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0012-2
Type :
conf
DOI :
10.1109/ECTC.1991.163934
Filename :
163934
Link To Document :
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