DocumentCode :
2043532
Title :
Acetylene-terminated low-stress polyimide oligomer for interlayer dielectric applications
Author :
Jobe, P.G. ; Puglisi, C. ; McMahon, J. ; Rossi, R.D.
Author_Institution :
Nat. Starch & Chem. Co., Bridgewater, NJ, USA
fYear :
1991
fDate :
11-16 May 1991
Firstpage :
568
Lastpage :
571
Abstract :
The authors describe a novel low-stress, acetylene-terminated polyimide well suited as the interlayer dielectric for MCMs (multichip modules). For successful application as an interlayer dielectric in a high-density microelectronic package, organic polymers must possess a variety of demanding properties, e.g. processibility, mechanical strength, adhesion, low dielectric constant, low water absorption, minimal outgassing, low thermal expansion, etc. The appropriate balance of properties depend upon the specific application. The authors describe a unique, oligomeric approach toward providing these balanced properties with the ability to customize the final product performance. It is shown how the thermal expansion and resulting residual film stress can be controlled by the proper choice of oligomeric structure. Acetylene end-capped polyisoimide oligomers with low thermal expansion from which low-stress dielectric films can be prepared are demonstrated. The properties and processing of these films are discussed and compared to conventional acetylene end-capped polyimide films
Keywords :
hybrid integrated circuits; polymer films; MCMs; acetylene end-capped polyimide films; acetylene-terminated polyimide; adhesion; high-density interconnect; high-density microelectronic package; interlayer dielectric; low dielectric constant; low thermal expansion; low water absorption; low-stress dielectric films; mechanical strength; minimal outgassing; multichip modules; polyimide oligomer; polyisoimide oligomers; processibility; processing; properties; residual film stress; thermal expansion; Adhesives; Dielectrics; Mechanical factors; Microelectronics; Multichip modules; Packaging; Polyimides; Polymers; Thermal expansion; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0012-2
Type :
conf
DOI :
10.1109/ECTC.1991.163935
Filename :
163935
Link To Document :
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