DocumentCode :
2043670
Title :
Effect of interfacial reaction layer on the brittle fracture of the SAC305 solder joint on ENIG and ENEPIG surface finish
Author :
Sang-Hyun Kwon ; Kang-Dong Kim ; Deok-Gon Han ; Tae-Hyun Sung ; Chang-Woo Lee ; Sehoon Yoo
Author_Institution :
Micro-Joining Center, Korea Inst. of Ind. Technol., Incheon, South Korea
fYear :
2012
fDate :
13-16 Dec. 2012
Firstpage :
1
Lastpage :
3
Abstract :
Brittle fracture generally occurred when a high level of strain and strain rate is applied. Since the brittle fracture takes place in the layer of intermetallic compound(IMC), the controlling of the IMC layer is important to lower the occurrence of the brittle fracture. In this study, the IMC structure of the solder joints on electroless nickel immersion gold (ENIG) and electroless nickel electroless palladium immersion gold (ENEPIG) surface finish was observed and the brittle fracture behaviors of solder joints were analyzed with a high speed shear (HSS) test. The HSS test was carried out at various speeds of 100-2000mm/s and fracture surface was observed to understand the failure modes. The brittle fracture increased with increasing shear speed. In case of the ENIG sample, the IMC thickness and the percentage of brittle fracture increased as the increase of the metal turnover(MTO) increased. On the other hand, the ENEPIG sample did not show a significant increase of IMC thickness or the percentage of brittle fracture as the MTO increased. From TEM observation, nano-sized voids were formed in the NiSnP layers. As the MTO of the electroless Ni plating solution increased, the amount of the nano-sized voids increased.
Keywords :
brittle fracture; chemical reactions; copper alloys; electroplating; failure analysis; silver alloys; solders; surface finishing; tin alloys; transmission electron microscopy; voids (solid); ENEPIG surface finish; ENIG; HSS test; IMC layer; MTO; NiSnP; SAC305 solder joint; SnAgCu; TEM observation; brittle fracture behaviors; electroless nickel electroless palladium immersion gold; electroless nickel immersion gold; electroless nickel plating solution; failure modes; fracture surface; interfacial reaction layer effect; intermetallic compound layer; metal turnover; nanosized voids; speed shear test; strain rate; velocity 100 mm/s to 2000 mm/s;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
Conference_Location :
Lantau Island
Print_ISBN :
978-1-4673-4945-1
Electronic_ISBN :
978-1-4673-4943-7
Type :
conf
DOI :
10.1109/EMAP.2012.6507909
Filename :
6507909
Link To Document :
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