• DocumentCode
    2043781
  • Title

    Vertically Aligned Carbon Nanotubes for Field Emission Cathodes

  • Author

    Mauger, M. ; Mouton, R. ; Hamzaoui, O. ; Binh, Vu Thien

  • Author_Institution
    LPMCN-UMR CNRS, Univ. Lyon 1, Villeurbanne
  • fYear
    2006
  • fDate
    38899
  • Firstpage
    327
  • Lastpage
    328
  • Abstract
    Systematic field emission (FE) studies of cathodes made from arrays of individual vertically-aligned carbon nanotubes (va-CNTs) and arrays of isolated tufts of va-CNTs were performed in order to assess the most advantageous spatial configuration for FE stability and lifetime in a poor vacuum working environment (~10-7 torr), which is specific for industrial applications. We conclude that under large FE currents the back-ion sputtering, due to the ionization of the residual gas under the e-beam, destroyed the individual CNTs. This led to a gradual destruction of the CNTs in the arrays then to the failure of the cathode when most of them have disappeared. In the case of arrays of tufts of CNTs, results indicate that the consequence of the e-beam induced ion sputtering only pruned out the tuft. A tuft is still a FE site as long as one CNT exists. Under ion sputtering, the collective behavior of the tufts is the main reason for the observed extension of the FE lifetime by a factor in the range of 5 to 10 compared to isolated individual va-CNTs
  • Keywords
    carbon nanotubes; cathodes; electron beam effects; electron field emission; sputtering; C; FE currents; FE lifetime; FE stability; back-ion sputtering; e-beam induced ion sputtering; field emission cathodes; individual vertically-aligned carbon nanotube arrays; residual gas ionization; spatial configuration; va-CNT isolated tuft arrays; Carbon nanotubes; Cathodes; Inorganic materials; Ion implantation; Iron; Organic materials; Sputtering; Stability; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
  • Conference_Location
    Guilin
  • Print_ISBN
    1-4244-0401-0
  • Type

    conf

  • DOI
    10.1109/IVNC.2006.335491
  • Filename
    4134593