DocumentCode :
2043896
Title :
Study on thermal design due to downsizing of power module using coupled electrical-thermal-mechanical analysis
Author :
Yamada, Y. ; Qiang Yu ; Takahashi, Tatsuro ; Takagi, Yutaka
Author_Institution :
Yokohama Nat. Univ., Yokohama, Japan
fYear :
2012
fDate :
13-16 Dec. 2012
Firstpage :
1
Lastpage :
7
Abstract :
Recently, with the development of power electronics technology, the power modules have been used extensively and the demand for downsizing. At our laboratory, the power assist to support knee moving has been developing. And this product also uses power module to improve energy efficiency. The problem of the power module is thermal fatigue of the junction area between SiC chip and substrate. When downsize the power module, thermal design become more important because it gets more difficult to release heat produced in the module. In this study, assuming practical use of power assist, proposing a model of power module under power cycle test that allows further downsizing and reducing weight was conducted. And thermal design of power module was evaluated by using coupled electrical-thermal-mechanical analysis. The analysis using Finite Element Method (FEM) was operated to evaluate non-uniform temperature distribution in power module was estimated. Based on the results, the model of power module is proposed as effective solution for downsizing without reducing the reliability.
Keywords :
electronics packaging; finite element analysis; modules; power electronics; reliability; silicon compounds; temperature distribution; thermal analysis; thermal stress cracking; wide band gap semiconductors; FEM; SiC; coupled electrical-thermal-mechanical analysis; energy efficiency; finite element method; nonuniform temperature distribution evaluation; power cycle test; power electronics technology; power module; reducing weight; reliability; thermal design; thermal fatigue;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
Conference_Location :
Lantau Island
Print_ISBN :
978-1-4673-4945-1
Electronic_ISBN :
978-1-4673-4943-7
Type :
conf
DOI :
10.1109/EMAP.2012.6507917
Filename :
6507917
Link To Document :
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