• DocumentCode
    2043907
  • Title

    Beam Pattern Optimization Using MVDR and Simulated Annealing

  • Author

    Yanli, Yu ; Yingmin, Wang

  • Author_Institution
    Dept. of Acoust. & Inf., Northwestern Polytech. Univ., Xi´´an, China
  • fYear
    2010
  • fDate
    4-5 June 2010
  • Firstpage
    117
  • Lastpage
    120
  • Abstract
    A novel numerical algorithm about pattern synthesis for sensor array with arbitrary geometric configuration is presented. Unlike conventional approaches, the method proposed is based on minimum variance distortionless response (MVDR) and Simulated Annealing. The method is aimed to minimize the side lobe peak of the beam pattern and compress the beam width. The method designs initial beam pattern using MVDR, take the weighting vector obtained as the initial weighting vector and then optimize the pattern further using Simulated Annealing. The method is flexible for optimal array pattern synthesis, and globally optimal solution can be determined efficiently due to Simulated Annealing optimization formulations. Array calibration based on the measurement array manifold is used to overcome the array model error. Compared to the conventional approach for array pattern synthesis, beam pattern designed by proposed method has better performance. Example about 24-element cross array is presented to illustrate the method. Obtained experimental results confirm the effectiveness of the approach in comparison with other techniques in the related literature.
  • Keywords
    antenna arrays; antenna radiation patterns; array signal processing; simulated annealing; MVDR; beam pattern optimization; minimum variance distortionless response; pattern synthesis; sensor array; side lobe peak minimization; simulated annealing; Arrays; Calibration; Computational modeling; Manifolds; Signal processing algorithms; Simulated annealing; Array Calibration; Energy Function; MVDR; Simulated Annealing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Service Oriented System Engineering (SOSE), 2010 Fifth IEEE International Symposium on
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-7327-4
  • Type

    conf

  • DOI
    10.1109/SOSE.2010.23
  • Filename
    5569919