Title :
Forecasting of bipolar integrated circuits hardness for various kinds of penetrating radiations
Author :
Dvornikov, O.V. ; Tchekhovski, V.A. ; Diatlov, V.L. ; Bogatyrev, Yu.V. ; Lastovski, S.B.
Author_Institution :
Joint stock Co. “MNIPI”, Minsk, Belarus
Abstract :
Experimental equipment for registration of parameters variation of integrated circuits (IC´s) which are in operation mode and influenced by a flux of electrons with 4 MeV energy is considered. It´s shown possibility of high energy electrons application for forecasting IC hardness to neutron and proton radiation.
Keywords :
bipolar integrated circuits; hardness; IC hardness forecasting; bipolar integrated circuits hardness forecasting; electrons flux; experimental equipment; integrated circuit parameters variation registration; penetrating radiations; Bipolar integrated circuits; Electronic mail; Forecasting; Iron; Materials; Neutrons;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2013 23rd International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-395-1
