Title :
Multiple stress aging of magnet wire by high frequency voltage pulses and high temperatures
Author :
Feilat, E.A. ; Grzybowski, S. ; Knight, P.
Author_Institution :
High Voltage Lab., Mississippi State Univ., MS, USA
Abstract :
This paper presents the results of multistress accelerated aging tests conducted on electrical insulation of fine gauge magnet wire used in high voltage coils of encapsulated flyback transformers. The aim of this work is to find an empirical electrical-thermal model to estimate the lifetime of the insulation exposed to multistress conditions including voltage and temperature at different high pulsating frequencies. The lifetime model was obtained by combining the Weibull distribution of failure data with electrical-thermal multistress aging model. The arbitrary parameters of the combined Weibull-life-stress model were obtained by maximum likelihood estimation
Keywords :
Weibull distribution; coils; high-frequency transformers; insulation testing; life testing; maximum likelihood estimation; transformer insulation; Weibull distribution; arbitrary parameters; combined Weibull-life-stress model; electrical insulation; empirical electrical-thermal model; encapsulated flyback transformers; fine gauge wire; high frequency voltage pulses; high temperatures; high voltage coils; insulation lifetime; magnet wire; maximum likelihood estimation; multiple stress aging; multistress accelerated aging tests; polyurethane enamel insulation; Accelerated aging; Cable insulation; Coils; Dielectrics and electrical insulation; Frequency estimation; Insulation testing; Power transformer insulation; Stress; Voltage; Wire;
Conference_Titel :
Electrical Insulation, 2000. Conference Record of the 2000 IEEE International Symposium on
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-5931-3
DOI :
10.1109/ELINSL.2000.845479
