DocumentCode :
2045060
Title :
Hybrid Si-SiC fast switching cell modelling and characterisation including parasitic environment description by PEEC method
Author :
Besacier, M. ; Coyaud, M. ; Schanen, J.L. ; Roudet, J. ; Rivet, B.
Author_Institution :
Lab. d´´Electrotechnique, Univ. Joseph Fourier, Grenoble, France
Volume :
4
fYear :
2002
fDate :
2002
Firstpage :
1753
Lastpage :
1757
Abstract :
Silicon carbide (SiC) Schottky rectifiers are now available for high voltage (600 V and above). They allow major improvement in power converter efficiency compared with the state-of-the-art of silicon bipolar. In association with latest fast MOSFET in hybrid switching cell (Si MOSFET + SiC diode), switching losses can be dramatically decreased by switching speed improvement. Then, due to high switching speed, the parasitic effects must be taken into account if an accurate description of the cell is needed. Even if intrinsic performances of the new MOSFET are very good (among others, low charges or superjunction technologies), paralleled capacitors and serial inductances of the cell environment limit the practical switching speed. The aim of this work is to propose an accurate model of this new switching cell. This model will be implemented in a temporal simulator in order to give predictive waveforms in losses and EMI investigations in power factor correction. A complete model of the switching cell is presented, which includes intrinsic characteristics of semiconductor with nonlinear capacitance in diode and MOSFET model. Parasitic behaviours are also taken into account with the PEEC method. Experiment and simulation results are compared and they show that accurate waveforms are obtained even in high switching speed
Keywords :
electromagnetic interference; equivalent circuits; field effect transistor switches; power MOSFET; power semiconductor switches; semiconductor device models; silicon; silicon compounds; EMI; MOSFET; PEEL method; Si-SiC; high switching speed; hybrid Si-SiC fast switching cell modelling; intrinsic characteristics; losses; nonlinear capacitance; paralleled capacitors; parasitic environment description; partial element equivalent circuit method; power converter efficiency; power factor correction; predictive waveforms; serial inductances; silicon carbide Schottky rectifiers; switching speed improvement; temporal simulator; Capacitors; MOSFET circuits; Power semiconductor switches; Predictive models; Rectifiers; Schottky diodes; Semiconductor diodes; Silicon carbide; Switching loss; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 2002. pesc 02. 2002 IEEE 33rd Annual
Conference_Location :
Cairns, Qld.
Print_ISBN :
0-7803-7262-X
Type :
conf
DOI :
10.1109/PSEC.2002.1023064
Filename :
1023064
Link To Document :
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