• DocumentCode
    2045180
  • Title

    Robustness analysis of electronic systems: other application conditions

  • Author

    Delgado-Romero, J.J.D. ; Hernández-Morales, E. ; González-Garza, R.S.

  • Author_Institution
    Departamento de Ingenieria Electronica, Instituto Tecnologico de Morelia, Mexico
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    458
  • Abstract
    We describe some application conditions to guarantee robust stability of electronic circuits represented by a linear time invariant system with parametric uncertainty. An interval matrix is used to give the parametric uncertainty. The principal motivation of this work is given by the existence of dynamic systems with parametric uncertainty in its models. In this work we make robustness analysis using the tests given in Delgado-Romero (1994, 1995, 1996). We know the stability of a continuous linear time invariant systems is given only by matrix A; if the system contains parametric uncertainty, then A can be an interval matrix A= [L, U]
  • Keywords
    eigenvalues and eigenfunctions; linear network analysis; linear systems; matrix algebra; stability; dynamic systems; electronic circuits; electronic systems; interval matrix; linear time invariant system; parametric uncertainty; robustness analysis; Circuit stability; Circuit testing; Continuous time systems; Eigenvalues and eigenfunctions; Electronic circuits; Robust stability; Robustness; Stability analysis; Time invariant systems; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 2000. IECON 2000. 26th Annual Confjerence of the IEEE
  • Conference_Location
    Nagoya
  • Print_ISBN
    0-7803-6456-2
  • Type

    conf

  • DOI
    10.1109/IECON.2000.973193
  • Filename
    973193