• DocumentCode
    2045360
  • Title

    Characteristics of VFTO generated in a GIS with SF6-N 2 gas mixture as the insulating medium

  • Author

    Singha, Santanu ; M, Joy Thomas ; Naidu, M.S.

  • Author_Institution
    Dept. of High Voltage Eng., Indian Inst. of Sci., Bangalore, India
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    284
  • Lastpage
    287
  • Abstract
    This paper deals with the experimental characteristics of VFTO in pure N2, pure SF6 and SF6-N2 mixtures. The investigations are performed using a laboratory model bus duct. A capacitive type voltage sensor was used to measure the VFTO peak magnitudes and temporal characteristics. Measurements were carried out in N2, SF6 and SF6-N2 mixtures wherein the SF6 concentration was varied from 10% to 40% over a pressure range of 1 bar to 5 bars. The results from the VFTO characteristics obtained for SF6 and SF6-N2 mixtures show similar trends in variations. The levels of surge peak magnitudes are less than 2 p,u. for all the cases considered in the experimental pressure range. In N2, the peak magnitude remains almost constant with increasing pressure but for pure SF6 , it increases almost linearly with pressure. On the other hand, for the gas mixtures, the difference in peak magnitudes is not significant at pressures between 2 to 4 bars. The occurrence of corona stabilization during breakdown of the gap is thought to be the cause for this behavior
  • Keywords
    SF6 insulation; corona; gas insulated substations; gas mixtures; nitrogen; surges; transients; 1 to 5 bar; GIS; N2; SF6; SF6-N2; VFTO generation; VFTO peak magnitudes; capacitive type voltage sensor; corona stabilization; gap breakdown; gas insulated bus duct; surge peak magnitudes; temporal characteristics; transients; Bars; Capacitive sensors; Character generation; Ducts; Geographic Information Systems; Laboratories; Pressure measurement; Sensor phenomena and characterization; Surges; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2000. Conference Record of the 2000 IEEE International Symposium on
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-5931-3
  • Type

    conf

  • DOI
    10.1109/ELINSL.2000.845508
  • Filename
    845508