DocumentCode
2045360
Title
Characteristics of VFTO generated in a GIS with SF6-N 2 gas mixture as the insulating medium
Author
Singha, Santanu ; M, Joy Thomas ; Naidu, M.S.
Author_Institution
Dept. of High Voltage Eng., Indian Inst. of Sci., Bangalore, India
fYear
2000
fDate
2000
Firstpage
284
Lastpage
287
Abstract
This paper deals with the experimental characteristics of VFTO in pure N2, pure SF6 and SF6-N2 mixtures. The investigations are performed using a laboratory model bus duct. A capacitive type voltage sensor was used to measure the VFTO peak magnitudes and temporal characteristics. Measurements were carried out in N2, SF6 and SF6-N2 mixtures wherein the SF6 concentration was varied from 10% to 40% over a pressure range of 1 bar to 5 bars. The results from the VFTO characteristics obtained for SF6 and SF6-N2 mixtures show similar trends in variations. The levels of surge peak magnitudes are less than 2 p,u. for all the cases considered in the experimental pressure range. In N2, the peak magnitude remains almost constant with increasing pressure but for pure SF6 , it increases almost linearly with pressure. On the other hand, for the gas mixtures, the difference in peak magnitudes is not significant at pressures between 2 to 4 bars. The occurrence of corona stabilization during breakdown of the gap is thought to be the cause for this behavior
Keywords
SF6 insulation; corona; gas insulated substations; gas mixtures; nitrogen; surges; transients; 1 to 5 bar; GIS; N2; SF6; SF6-N2; VFTO generation; VFTO peak magnitudes; capacitive type voltage sensor; corona stabilization; gap breakdown; gas insulated bus duct; surge peak magnitudes; temporal characteristics; transients; Bars; Capacitive sensors; Character generation; Ducts; Geographic Information Systems; Laboratories; Pressure measurement; Sensor phenomena and characterization; Surges; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 2000. Conference Record of the 2000 IEEE International Symposium on
Conference_Location
Anaheim, CA
ISSN
1089-084X
Print_ISBN
0-7803-5931-3
Type
conf
DOI
10.1109/ELINSL.2000.845508
Filename
845508
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