DocumentCode :
2045360
Title :
Characteristics of VFTO generated in a GIS with SF6-N 2 gas mixture as the insulating medium
Author :
Singha, Santanu ; M, Joy Thomas ; Naidu, M.S.
Author_Institution :
Dept. of High Voltage Eng., Indian Inst. of Sci., Bangalore, India
fYear :
2000
fDate :
2000
Firstpage :
284
Lastpage :
287
Abstract :
This paper deals with the experimental characteristics of VFTO in pure N2, pure SF6 and SF6-N2 mixtures. The investigations are performed using a laboratory model bus duct. A capacitive type voltage sensor was used to measure the VFTO peak magnitudes and temporal characteristics. Measurements were carried out in N2, SF6 and SF6-N2 mixtures wherein the SF6 concentration was varied from 10% to 40% over a pressure range of 1 bar to 5 bars. The results from the VFTO characteristics obtained for SF6 and SF6-N2 mixtures show similar trends in variations. The levels of surge peak magnitudes are less than 2 p,u. for all the cases considered in the experimental pressure range. In N2, the peak magnitude remains almost constant with increasing pressure but for pure SF6 , it increases almost linearly with pressure. On the other hand, for the gas mixtures, the difference in peak magnitudes is not significant at pressures between 2 to 4 bars. The occurrence of corona stabilization during breakdown of the gap is thought to be the cause for this behavior
Keywords :
SF6 insulation; corona; gas insulated substations; gas mixtures; nitrogen; surges; transients; 1 to 5 bar; GIS; N2; SF6; SF6-N2; VFTO generation; VFTO peak magnitudes; capacitive type voltage sensor; corona stabilization; gap breakdown; gas insulated bus duct; surge peak magnitudes; temporal characteristics; transients; Bars; Capacitive sensors; Character generation; Ducts; Geographic Information Systems; Laboratories; Pressure measurement; Sensor phenomena and characterization; Surges; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 2000. Conference Record of the 2000 IEEE International Symposium on
Conference_Location :
Anaheim, CA
ISSN :
1089-084X
Print_ISBN :
0-7803-5931-3
Type :
conf
DOI :
10.1109/ELINSL.2000.845508
Filename :
845508
Link To Document :
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