DocumentCode :
2045669
Title :
A Bayard-Alpert Ionization Gauge Using Carbon Nanotube Cold Cathode
Author :
Huang, J.X. ; Chen, Jun ; Deng, S.Z. ; Xu, N.S.
Author_Institution :
State Key Lab. of Optoelectron. Mater. & Technol., Zhongshan Univ., Guangzhou
fYear :
2006
fDate :
38899
Firstpage :
479
Lastpage :
480
Abstract :
A Bayard-Alpert ionization gauge with a carbon nanotube (CNT) field emitter was fabricated and tested. CNTs were grown on stainless steel rods by thermal chemical vapor deposition at 900degC in a mixture of CH4 an H2 gas. The structure of the as-grown CNTs was investigated using scanning electron microscopy, transmission electron microscopy and Raman spectroscopy. The longtime field emission stability, pressure dependence of sensitivity, and the relationship between sensitivity, current transmission ratio of electrons and the voltage of the grid were also investigated
Keywords :
CVD coatings; Raman spectra; carbon nanotubes; cathodes; cold-cathode tubes; electric current; electron field emission; ionisation gauges; nanotube devices; scanning electron microscopy; sensitivity; transmission electron microscopy; vacuum microelectronics; 900 degC; Bayard-Alpert ionization gauge; C; CH4 gas mixture; H2 gas mixture; Raman spectroscopy; carbon nanotube cold cathode; carbon nanotube field emitter; electron current transmission ratio; grid voltage; longtime field emission stability; nanotube structure; pressure dependence; scanning electron microscopy; sensitivity; stainless steel rods; thermal chemical vapor deposition; transmission electron microscopy; Carbon nanotubes; Cathodes; Chemical vapor deposition; Ionization; Raman scattering; Scanning electron microscopy; Spectroscopy; Steel; Testing; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
Type :
conf
DOI :
10.1109/IVNC.2006.335276
Filename :
4134668
Link To Document :
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