DocumentCode :
2045942
Title :
Nanoclustering in a MA/ODS Ferritic Alloy
Author :
Miller, M.K. ; Fu, C.L. ; Liu, C.T. ; Hoelzer, D.T. ; Russell, K.F.
Author_Institution :
Div. of Mater. Sci. & Technol., Oak Ridge Nat. Lab., TN
fYear :
2006
fDate :
38899
Firstpage :
505
Lastpage :
506
Abstract :
A new higher chromium variant of mechanically alloyed (MA) oxide dispersion strengthened (ODS) ferritic alloy, designated 14YWT, has been developed. The microstructures of this alloy have been characterized in the local electrode atom probe from the initial ball milled flakes through the extruded material that was heat treated at up to 1380degC. No nanoclusters were found in the ball milled flakes but some layering of yttrium and oxygen was observed. A high number density of Ti-, Y- and O-enriched nanoclusters was observed in the flakes after a simulated extrusion treatment of 1 h at 850degC. The nanoclusters were also observed after annealing an extruded rod for 1 h at 1380degC and the grain boundaries were found to be enriched in chromium and tungsten. Results of first-principles calculations on oxygen binding energy in the presence of vacancies suggest that the condition for stable nanoclusters is a well-dispersed Y distribution with more Ti than Y
Keywords :
annealing; ball milling; binding energy; chromium alloys; extrusion; grain boundaries; iron alloys; nanostructured materials; titanium alloys; tungsten alloys; vacancies (crystal); yttrium compounds; 1 h; 1380 degC; 14YWT alloy flakes; 850 degC; FeCrWTi-Y2O3; MA-ODS ferritic alloys; annealing; ball milling; binding energy; extrusion; first-principles calculations; grain boundaries; heat treatment; local electrode atom probe; mechanically alloyed oxide dispersion strengthened ferritic alloy; microstructure; nanoclustering; vacancies; Annealing; Atomic layer deposition; Ball milling; Chromium alloys; Electrodes; Grain boundaries; Microstructure; Probes; Tungsten; Yttrium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
Type :
conf
DOI :
10.1109/IVNC.2006.335298
Filename :
4134681
Link To Document :
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