Title :
Interfacial Partitioning in Single Crystal Ru-bearing Superalloys
Author :
Miller, M.K. ; Russell, K.F. ; Tin, S.
Author_Institution :
Div. of Mater. Sci. & Technol., Oak Ridge Nat. Lab., TN
Abstract :
In this paper, local electrode atom probe is used to characterize the differences in interfacial partitioning that occurs between the TCP, gamma and gammasquare phases in single-crystal Ru-bearing Ni-based superalloys. Identification of the compositional variations in the topologically-close-packed (TCP) phases is also presented
Keywords :
atom probe field ion microscopy; crystal microstructure; nickel alloys; ruthenium alloys; superalloys; TCP phases; crystal microstructure; gamma phase; interfacial partitioning; local electrode atom probe; single-crystal Ru-bearing superalloys; topologically-close-packed phases; Aerospace materials; Composite materials; Crystalline materials; Electron beams; Laboratories; Materials science and technology; Mechanical factors; Probes; Temperature; Tin;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
DOI :
10.1109/IVNC.2006.335300
