• DocumentCode
    2046057
  • Title

    Using the EM simulation tools to predict EMC immunity behavior of a automotive electronic board after a component change

  • Author

    Durier, Andre ; Marot, Christian ; Alilou, Oussama

  • Author_Institution
    Quality Labs. EMC Design Support, Continental Automotive France SAS, Toulouse, France
  • fYear
    2013
  • fDate
    2-6 Sept. 2013
  • Firstpage
    57
  • Lastpage
    62
  • Abstract
    Integrated Circuit obsolescence is a strong economic constraint for electronic suppliers. It becomes essential to develop a methodology aiming to guarantee the non regression of EMC performances of equipments during an immunity test. The use of numerical simulation tools seems to be a way to reach this target. But these tools need first EMC behavioral component´s models built from the most appropriate EMC measurements.
  • Keywords
    automotive electronics; electromagnetic compatibility; integrated circuits; numerical analysis; EM simulation tool; EMC immunity behavior; automotive electronic board; electronic supplier; integrated circuit; numerical simulation tool; Current measurement; Immunity testing; Integrated circuit modeling; Probes; Regulators; Wires; BCI; DPI; IC immunity; immunity modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC EUROPE), 2013 International Symposium on
  • Conference_Location
    Brugge
  • ISSN
    2325-0356
  • Type

    conf

  • Filename
    6653202