DocumentCode :
2046113
Title :
Standard Deviation of Composition Measurements in Atom Probe Analysis
Author :
Danoix, F. ; Grancher, G. ; Bostel, A. ; Blavette, D.
Author_Institution :
Groupe de Phys. des Materiaux, Rouen Univ., Saint Etienne du Rouvray
fYear :
2006
fDate :
38899
Firstpage :
519
Lastpage :
519
Abstract :
Summary form only given. Atom Probe is a unique instrument to measure concentrations in metallic materials in volumes ranging from one to several ten thousands cubic nanometers. It can be used to measure the local concentration of the whole analysed volume, or to estimate the alloy composition. The list of detected atoms can be segmented into equal sized (in terms of number of atoms) sub-blocks, in which local composition is measured, leading to classical concentration profiles. Alternatively, due to the positioning capabilities of 3D atom probes, composition measurements can be focused on spatially selected areas, or concentration profiles calculated over constant sampling volumes. As each of these measurement procedure is different (as well as the information to be estimated) the variances of the obtained compositions should be estimated accordingly. This contribution is devoted to derive analytical expressions of the variance in several standard situations encountered when using atom probe. The particular aspect of the influence of the detector efficiency (which is generally not equal to unity...) on the estimates of composition measurement accuracy will be discussed
Keywords :
atom probe field ion microscopy; analytical variance expressions; atom probe analysis; composition measurement accuracy; detector efficiency; metallic materials; standard deviation; Area measurement; Atomic measurements; Inorganic materials; Instruments; Measurement standards; Position measurement; Probes; Sampling methods; Size measurement; Volume measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
Type :
conf
DOI :
10.1109/IVNC.2006.335324
Filename :
4134688
Link To Document :
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