Title :
Industrial utilization of the adsorption effect of optical fibers for the detection of critical micelle concentration
Author :
Ogita, M. ; Hasegawa, T. ; Mehta, M.A. ; Fujinami, T. ; Hatanaka, Y.
Author_Institution :
Fac. of Eng., Shizuoka Univ., Hamamatsu, Japan
Abstract :
The critical micelle concentration (CMC) of surfactant solutions is detected using an optical fiber. The detection is mainly performed using a sample solution of sodium dodecylbenzenesulfonate. The principle of the detection is that an incident beam is reflected at the interface between the fiber core and the solution. Repeated reflection and passage through the sensing region occurs along the fiber. The change in adsorption condition leads to an effective change of the refractive index in the vicinity of the core surface. The output power suddenly increases at the CMC due to the change in reflectivity caused by adsorption of surfactant molecules onto the core surface. Two different kinds of fiber, plastic cladding silica fiber (PCS) with a silica core and plastic optical fiber (POF) with a plastic core, were used for the experiments. The cores are hydrophilic and hydrophobic, respectively. The output from both PCS and POF fibers shows a large change in the vicinity of the CMC point as the concentration of surfactant increases. The data from our optical method using a fiber agreed well with those adsorption isotherms by the weight method. The CMC detection using an LED is also proposed
Keywords :
adsorption; chemical variables measurement; fibre optic sensors; reflectivity; refractive index; adsorption effect; critical micelle concentration detection; hydrophilic core; hydrophobic core; optical fiber sensor; plastic cladding silica fiber; plastic optical fiber; reflection; reflectivity; refractive index; surfactant molecules; surfactant solutions; Optical detectors; Optical fibers; Optical reflection; Optical refraction; Personal communication networks; Plastics; Power generation; Reflectivity; Refractive index; Silicon compounds;
Conference_Titel :
Industrial Electronics Society, 2000. IECON 2000. 26th Annual Confjerence of the IEEE
Conference_Location :
Nagoya
Print_ISBN :
0-7803-6456-2
DOI :
10.1109/IECON.2000.973234