Title :
Performance of possible combinations of detection schemes with V-BLAST for MIMO OFDM systems
Author :
Deepa, R. ; Iswarya, S. ; Shri, G. Divya ; Keshav, P. Mahathi ; JaganyaVasan, P. ; Murugan, S.S.
Author_Institution :
Dept. of Electron. & Commun., Amrita Vishwa Vidhyapeetham, Coimbatore, India
Abstract :
The fast-growing wireless communication field demands high transmission capacity and quality. In order to achieve the above requirements, the best approach for real time application would be combining Multi-Input Multi-Output (MIMO) and Orthogonal Frequency Division Multiplexing (OFDM). Vertical Bell-Labs Layered Space Time (V-BLAST) is a symbol-detection algorithm. The combination of V-BLAST with other available detection schemes improves system performance significantly. In this paper, the possible combinations of detection schemes along with V-BLAST is compared based on their Minimum Bit Error Rates (MBER) to their corresponding Signal to Noise Ratio (SNR) values and the best promising combination is proposed. Also the transmit power of antennas is allocated for the best combination using the Lagrangian procedure and is compared with the conventional power allocation scheme.
Keywords :
MIMO communication; OFDM modulation; antenna arrays; signal detection; transmitting antennas; Lagrangian procedure; MBER; MIMO OFDM systems; SNR values; V-BLAST detection schemes; minimum bit error rates; multiinput multioutput system; orthogonal frequency division multiplexing; signal to noise ratio; symbol-detection algorithm; transmission capacity; transmit antenna power allocation; vertical Bell-labs layered space time; wireless communication; Bit error rate; Detection algorithms; MIMO; OFDM; Resource management; Signal to noise ratio; Transmitting antennas; Lagrangian method; MIMO; Minimum BER; OFDM; Power allocation; V-BLAST;
Conference_Titel :
Electronics Computer Technology (ICECT), 2011 3rd International Conference on
Conference_Location :
Kanyakumari
Print_ISBN :
978-1-4244-8678-6
Electronic_ISBN :
978-1-4244-8679-3
DOI :
10.1109/ICECTECH.2011.5942068