• DocumentCode
    2046552
  • Title

    Role of Strain-Compensated Clusters in Al-Alloy Design

  • Author

    Radmilovic, Velimir ; Miller, Michael K. ; Mitlin, David ; Dahmen, Ulrich

  • Author_Institution
    Lawrence Berkeley Lab., California Univ., Berkeley, CA
  • fYear
    2006
  • fDate
    38899
  • Firstpage
    553
  • Lastpage
    554
  • Abstract
    Atom probe tomography has been combined with high resolution transmission electron microscopy (HRTEM) to confirm the existence of such clusters by atomic resolution observation. HRTEM images indicate that the solute clusters are ~3 nm in diameter and contains ~850 atoms. The clusters have diffuse boundaries, maintain the same crystal structure as the host lattice and are roughly spherical in shape. Clusters were face-centered cubic and contained up to 80 at.% Al, whereas the precipitates were diamond cubic and contained no Al. Although the existence of strain-compensated Si-Ge clusters had been postulated previously, this direct observation clarifies their role in the microstructural evolution and provide a more systematic use of this phenomenon
  • Keywords
    Ge-Si alloys; aluminium alloys; crystal structure; precipitation; semiconductor materials; tomography; transmission electron microscopy; Al-alloy design; HRTEM; SiGe; atom probe tomography; crystal structure; diffuse boundaries; face-centered cubic; high resolution transmission electron microscopy; host lattice; microstructural evolution; precipitates; solute clusters; strain-compensated clusters; Aging; Chemical engineering; Chemical technology; Contracts; Cyclotrons; Electron microscopy; Laboratories; Lattices; Materials science and technology; Power engineering and energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
  • Conference_Location
    Guilin
  • Print_ISBN
    1-4244-0401-0
  • Type

    conf

  • DOI
    10.1109/IVNC.2006.335341
  • Filename
    4134705