• DocumentCode
    2046591
  • Title

    High Temperature Field Evaporation of Tantalum Emitter

  • Author

    Golubev, Oleg L. ; N.M., Blashenkov ; Ya., Lavrent´ev G.

  • Author_Institution
    A.F. Ioffe Phys. Tech. Inst., Russian Acad. of Sci., St. Petersburg
  • fYear
    2006
  • fDate
    38899
  • Firstpage
    557
  • Lastpage
    558
  • Abstract
    A magnetic atom probe is used to study the high temperature field evaporation of Ta emitters. Varying concentrations of Ta3+ and Ta2+ ions are observed within the 300-2500 K temperature range while Ta+ ions only exist at high temperatures. Increasing temperature leads to reduction of evaporation field intensity causing the decrease in the charges of ions
  • Keywords
    field evaporation; field ion emission; high-temperature effects; tantalum; 300 to 2500 K; Ta; evaporation field intensity; high temperature field evaporation; ion charge; ion concentrations; magnetic atom probe; tantalum emitter; Atomic measurements; Contracts; Instruments; Iron; Probes; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
  • Conference_Location
    Guilin
  • Print_ISBN
    1-4244-0401-0
  • Type

    conf

  • DOI
    10.1109/IVNC.2006.335360
  • Filename
    4134707
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2046591