Title :
Statistically based autoscaling method for mixed-signal circuits
Author :
Hejn, Konrad ; Pacut, Andrzej
Author_Institution :
Fac. of Electron. & Inf. Technol., Warsaw Univ. of Technol., Poland
Abstract :
The paper includes a theory and simulation results of the statistically based concurrent corrector for mixed-signal circuits. Its dynamics, asymptotic accuracy, and certain problems related to measurements of its metrological parameters are analysed in detail
Keywords :
analogue-digital conversion; circuit analysis computing; correlation methods; error compensation; mixed analogue-digital integrated circuits; scaling circuits; stochastic processes; ADC; asymptotic accuracy; binary dither; compensation; concurrent corrector; dynamic conditions; gain drift; metrological parameters; mixed-signal circuits; pseudorandom generator; simulation; statistically based autoscaling method; stochastic technique; vector signal analyser; Aging; Circuit simulation; Equations; Helium; Human factors; Information technology; Paper technology; Steady-state; Temperature; World Wide Web;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
DOI :
10.1109/IMTC.1996.507320
