Title :
A comparative analysis of input stimuli for testing mixed-signal LSIs based on current testing
Author_Institution :
Dept. of Electron. & Inf. Eng., Tokyo Metropolitan Univ., Japan
Abstract :
This paper describes the comparison of input stimuli as a means of testing mixed-signal circuits. Current testing that measures the integral of the power supply current in the time-domain is used to detect faults. The main objective is to achieve real-time testing in which there is no need to analyze the results of testing. Simulation results show that a step-voltage input stimulus is effective for detection of bridging and breaking faults in an A/D converter. Since this input signal allows the current to be measured at discrete time intervals, it is applicable for real-time current testing and can be used for built-in test and production test
Keywords :
SPICE; analogue-digital conversion; automatic testing; digital simulation; electric current measurement; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; A/D converter; breaking faults; built-in test; comparative analysis; current testing; detection of bridging faults; discrete time intervals; input stimuli; mixed-signal LSI; power supply current; production test; real-time current testing; real-time testing; simulation; step-voltage input stimulus; time-domain; Circuit faults; Circuit simulation; Circuit testing; Current measurement; Current supplies; Electrical fault detection; Fault detection; Power measurement; Power supplies; Time domain analysis;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529819
