DocumentCode
2046957
Title
Spatially distributed 3D circuit models
Author
Beattie, Michael ; Zheng, Hui ; Devgan, Anirudh ; Krauter, Byron
Author_Institution
Electron. Design Autom., IBM Corp., Austin, TX, USA
fYear
2005
fDate
13-17 June 2005
Firstpage
153
Lastpage
158
Abstract
Spatially distributed 3D circuit models are extracted with a segment-to-segment BEM (boundary element method) algorithm for both capacitance and inverse inductance couplings rather than using the traditional net-to-net approach. Critical issues regarding the extraction efficiency and accuracy of segment-to-segment BEM capacitance models are explored. An adaptive discretization scheme is developed for segment-to-segment capacitance extraction and also applied to segment-to-segment high-frequency inverse inductance extraction. We demonstrate the limitations of the duality between capacitance and inverse inductance. Examples demonstrating the accuracy of these models are presented for real packaging cases.
Keywords
ball grid arrays; boundary-elements methods; circuit analysis computing; integrated circuit modelling; integrated circuit packaging; adaptive discretization; ball grid arrays; boundary element method algorithm; capacitance coupling; extraction efficiency; integrated circuit modelling; integrated circuit packaging; inverse inductance coupling; segment-to-segment BEM algorithm; segment-to-segment BEM capacitance models; segment-to-segment capacitance extraction; segment-to-segment high-frequency inverse inductance extraction; spatially distributed 3D circuit models; Capacitance; Coupling circuits; Data mining; Design automation; Electrostatics; Inductance; Inverse problems; Magnetostatics; Shape; Sparse matrices;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2005. Proceedings. 42nd
Print_ISBN
1-59593-058-2
Type
conf
DOI
10.1109/DAC.2005.193790
Filename
1510309
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