• DocumentCode
    2046957
  • Title

    Spatially distributed 3D circuit models

  • Author

    Beattie, Michael ; Zheng, Hui ; Devgan, Anirudh ; Krauter, Byron

  • Author_Institution
    Electron. Design Autom., IBM Corp., Austin, TX, USA
  • fYear
    2005
  • fDate
    13-17 June 2005
  • Firstpage
    153
  • Lastpage
    158
  • Abstract
    Spatially distributed 3D circuit models are extracted with a segment-to-segment BEM (boundary element method) algorithm for both capacitance and inverse inductance couplings rather than using the traditional net-to-net approach. Critical issues regarding the extraction efficiency and accuracy of segment-to-segment BEM capacitance models are explored. An adaptive discretization scheme is developed for segment-to-segment capacitance extraction and also applied to segment-to-segment high-frequency inverse inductance extraction. We demonstrate the limitations of the duality between capacitance and inverse inductance. Examples demonstrating the accuracy of these models are presented for real packaging cases.
  • Keywords
    ball grid arrays; boundary-elements methods; circuit analysis computing; integrated circuit modelling; integrated circuit packaging; adaptive discretization; ball grid arrays; boundary element method algorithm; capacitance coupling; extraction efficiency; integrated circuit modelling; integrated circuit packaging; inverse inductance coupling; segment-to-segment BEM algorithm; segment-to-segment BEM capacitance models; segment-to-segment capacitance extraction; segment-to-segment high-frequency inverse inductance extraction; spatially distributed 3D circuit models; Capacitance; Coupling circuits; Data mining; Design automation; Electrostatics; Inductance; Inverse problems; Magnetostatics; Shape; Sparse matrices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2005. Proceedings. 42nd
  • Print_ISBN
    1-59593-058-2
  • Type

    conf

  • DOI
    10.1109/DAC.2005.193790
  • Filename
    1510309