• DocumentCode
    2046968
  • Title

    The study of self-alignment capability of electrically conductive adhesives (ECAs) using low melting point alloy for flip-chip application

  • Author

    Wong, C.P. ; Moon, Kyoung-Sik

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2001
  • fDate
    21-24 Oct. 2001
  • Firstpage
    112
  • Lastpage
    118
  • Abstract
    A feasibility study of the self-alignment capability of electrically conductive adhesives (ECAs) for a flip-chip interconnection application was carried out. The effect of the low melting alloy (LMA) filler on the self-alignment capability of ECAs was investigated. The surface energy of the epoxy resin was studied in terms of the various additives and their loading level using a goniometer with a built-in environmental chamber. The curing profile of the epoxy resin and the melting point of the LMA filler were measured using a differential scanning calorimeter (DSC). The ECAs filled with the LMA over 85 wt% showed self-alignment during the heating process. However, when silver flakes were added to the ECA formulation, self-alignment did not take place. We concluded that the LMA filler depleted into the silver flakes can adversely affect the self-alignment of ECAs. The key parameters required for ECA self-alignment capability are presented. This paper discusses the feasibility of the application of ECA with self-alignment capability for flip-chip interconnection. Initial results from these series studies indicate that incorporation of the LMA into ECAs is an efficient way to make ECAs with self-alignment capability.
  • Keywords
    adhesives; conducting polymers; differential scanning calorimetry; filled polymers; flip-chip devices; goniometers; heat treatment; integrated circuit interconnections; integrated circuit packaging; melting point; surface energy; Ag; DSC; ECA formulation; ECAs; LMA filler; additive loading level; additives; curing profile; differential scanning calorimeter; electrically conductive adhesives; environmental chamber; epoxy resin; flip-chip application; flip-chip interconnection; goniometer; low melting point alloy; melting point; self-alignment; self-alignment capability; silver flakes; surface energy; Conducting materials; Conductive adhesives; Epoxy resins; Independent component analysis; Integrated circuit interconnections; Materials science and technology; Silver; Surface tension; Surface-mount technology; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Polymers and Adhesives in Microelectronics and Photonics, 2001. First International IEEE Conference on
  • Conference_Location
    Potsdam, Germany
  • Print_ISBN
    0-7803-7220-4
  • Type

    conf

  • DOI
    10.1109/POLYTR.2001.973267
  • Filename
    973267