DocumentCode :
2047005
Title :
Improved reliability with underfilled area array packages
Author :
Schneider, Josef
Author_Institution :
Loctite Res. Dev. & Eng., Garching-Hochbruck, Germany
fYear :
2001
fDate :
21-24 Oct. 2001
Firstpage :
124
Lastpage :
129
Abstract :
Flip chip in package is expected to become a major solution for area array packages such as BGA (ball grid array) and CSP (chip scale package), which will represent over 20% of all flip chip devices by 2005 on a global scale. Manufacturers of portable electronic components such as mobile phones, laptops, camcorders, pagers or portable organisers are already using these packages to continue the steady reduction in size and weight. With the trends towards smaller pitch, smaller solder ball height and larger die size, the use of underfill material becomes more important. In particular, wafer level CSPs fall into this category, because they are similar to the bare chip attachment approach.
Keywords :
ball grid arrays; chip scale packaging; encapsulation; fine-pitch technology; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; microassembling; plastic packaging; soldering; BGA; CSP; area array packages; ball grid array; bare chip attachment; camcorders; chip scale package; die size; flip chip devices; flip chip in package; laptops; mobile phones; package pitch; pagers; portable electronic components; portable organisers; reliability; size reduction; solder ball height; underfilled area array packages; wafer level CSP; weight reduction; Assembly; Chip scale packaging; Electronic packaging thermal management; Electronics packaging; Flip chip; Laminates; Life testing; Mobile handsets; Wafer scale integration; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Polymers and Adhesives in Microelectronics and Photonics, 2001. First International IEEE Conference on
Conference_Location :
Potsdam, Germany
Print_ISBN :
0-7803-7220-4
Type :
conf
DOI :
10.1109/POLYTR.2001.973269
Filename :
973269
Link To Document :
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