DocumentCode
2047005
Title
Improved reliability with underfilled area array packages
Author
Schneider, Josef
Author_Institution
Loctite Res. Dev. & Eng., Garching-Hochbruck, Germany
fYear
2001
fDate
21-24 Oct. 2001
Firstpage
124
Lastpage
129
Abstract
Flip chip in package is expected to become a major solution for area array packages such as BGA (ball grid array) and CSP (chip scale package), which will represent over 20% of all flip chip devices by 2005 on a global scale. Manufacturers of portable electronic components such as mobile phones, laptops, camcorders, pagers or portable organisers are already using these packages to continue the steady reduction in size and weight. With the trends towards smaller pitch, smaller solder ball height and larger die size, the use of underfill material becomes more important. In particular, wafer level CSPs fall into this category, because they are similar to the bare chip attachment approach.
Keywords
ball grid arrays; chip scale packaging; encapsulation; fine-pitch technology; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; microassembling; plastic packaging; soldering; BGA; CSP; area array packages; ball grid array; bare chip attachment; camcorders; chip scale package; die size; flip chip devices; flip chip in package; laptops; mobile phones; package pitch; pagers; portable electronic components; portable organisers; reliability; size reduction; solder ball height; underfilled area array packages; wafer level CSP; weight reduction; Assembly; Chip scale packaging; Electronic packaging thermal management; Electronics packaging; Flip chip; Laminates; Life testing; Mobile handsets; Wafer scale integration; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Polymers and Adhesives in Microelectronics and Photonics, 2001. First International IEEE Conference on
Conference_Location
Potsdam, Germany
Print_ISBN
0-7803-7220-4
Type
conf
DOI
10.1109/POLYTR.2001.973269
Filename
973269
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