DocumentCode
2047278
Title
A method of extending an 1149.1 bus for mixed-signal testing
Author
Russell, Robert J.
Author_Institution
Bull Electron., Brighton, MA, USA
fYear
1996
fDate
20-25 Oct 1996
Firstpage
410
Lastpage
416
Abstract
A method for achieving mixed-signal test objectives within the established 1149.1 pin/wiring overhead is described. TMS and TCK pass both analog and digital signals. Compatibility with 1149.1 and P1149.4 is optional
Keywords
IEEE standards; automatic test equipment; digital instrumentation; electronic equipment testing; measurement standards; mixed analogue-digital integrated circuits; system buses; 1149.1 bus; 1149.1 pin/wiring overhead; TCK; TMS; analog signals; compatibility; digital signals; initialisation; mixed-signal testing; Automatic testing; Electronic equipment testing; Geometry; Life testing; Logic testing; Pins; Proposals; Stability; System testing; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1996. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-3541-4
Type
conf
DOI
10.1109/TEST.1996.557043
Filename
557043
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