Title :
A method of extending an 1149.1 bus for mixed-signal testing
Author :
Russell, Robert J.
Author_Institution :
Bull Electron., Brighton, MA, USA
Abstract :
A method for achieving mixed-signal test objectives within the established 1149.1 pin/wiring overhead is described. TMS and TCK pass both analog and digital signals. Compatibility with 1149.1 and P1149.4 is optional
Keywords :
IEEE standards; automatic test equipment; digital instrumentation; electronic equipment testing; measurement standards; mixed analogue-digital integrated circuits; system buses; 1149.1 bus; 1149.1 pin/wiring overhead; TCK; TMS; analog signals; compatibility; digital signals; initialisation; mixed-signal testing; Automatic testing; Electronic equipment testing; Geometry; Life testing; Logic testing; Pins; Proposals; Stability; System testing; Wires;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557043
