• DocumentCode
    2047280
  • Title

    A general purpose ATE based IDDQ measurement circuit

  • Author

    Johnson, Gerald H. ; Wilstrup, Jan B.

  • Author_Institution
    Megatest Corp., Fridley, MN, USA
  • fYear
    1995
  • fDate
    21-25 Oct 1995
  • Firstpage
    97
  • Lastpage
    105
  • Abstract
    Previously published measurement circuits offered good solutions for measuring IDDQ on a fairly narrow range of part types. Most of these solutions have required adding circuitry either to the DUT board or to the DUT itself. In this paper we describe a general purpose, ATE Pin Electronics Card based, IDDQ measurement circuit. It gives good results over a very wide range of device types, supply currents, switching currents, bypass capacitance and IDDQ currents
  • Keywords
    CMOS integrated circuits; automatic test equipment; electric current measurement; integrated circuit measurement; integrated circuit noise; ATE; CMOS; DUT board; IDDQ measurement circuit; Pin Electronics Card; bypass capacitance; noise; supply currents; switching currents; Capacitance; Capacitors; Circuit testing; Current measurement; Diodes; Frequency; Phasor measurement units; Resistors; Time measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1995. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-2992-9
  • Type

    conf

  • DOI
    10.1109/TEST.1995.529822
  • Filename
    529822
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2047280