Title :
Analysis of side writing asymmetry
Author :
Hozoi, A. ; Groenland, J.P.J. ; Albertini, J.B. ; Lodder, J.C.
Author_Institution :
Twente Univ., Enschede, Netherlands
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we investigate the side writing asymmetry of Helical Scan Silicon (HSS) heads and introduce a profiling method for studying the write process across the track width.
Keywords :
elemental semiconductors; ferromagnetic materials; magnetic heads; magnetic recording; silicon; SiO/sub 2/-NiFe-Si; helical scan silicon heads; profiling method; side writing asymmetry; track width; write process; Azimuth; CD recording; Disk recording; Magnetic analysis; Magnetic force microscopy; Magnetic heads; Prototypes; Silicon; Wavelength measurement; Writing;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230500
