Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Abstract :
Being short of the formal theory and methodology of program debugging, the aim of the investigation in this paper is to create an approach to support analysis and debugging of VLSI device test programs. In research into the previous work, we find that there are two restrictions in program debugging: computational complexity and diagnostic precision, which greatly influence the effect of program debugging. We apply Fuzzy Mathematics, especially Fuzzy Comprehensive Evaluation, to researches on fuzzy knowledge representation, fuzzy relation, and fuzzy inference, etc. in the test programs analysis. In the paper, we analyze the construction of the test program, present the concept of test entities, and build the evaluation space of the test entities, etc. Lastly we address an algorithm, with an example, of the selection of the test entities to be debugged
Keywords :
VLSI; automatic testing; fuzzy set theory; inference mechanisms; integrated circuit testing; knowledge representation; program debugging; VLSI; computational complexity; device test programs; diagnostic precision; evaluation space; fuzzy comprehensive evaluation; fuzzy inference; fuzzy knowledge representation; fuzzy mathematics; fuzzy relation; program debugging; test entities; test programs analysis; Computers; Debugging; Electronic mail; Fuzzy sets; Humans; Knowledge representation; Microelectronics; Testing; Uncertainty; Very large scale integration;
