Digital integrated circuit testing using transient signal analysis

Author

Plusquellic, James E. ; Chiarulli, Donald M. ; Levitan, Steven P.

Author_Institution

Dept. of Comput. Sci., Pittsburgh Univ., PA, USA

fYear

1996

fDate

20-25 Oct 1996

Firstpage

481

Lastpage

490

Abstract

A novel approach to testing CMOS digital circuits is presented that is based on an analysis of I_DD switching transients on the supply rails and voltage transients at selected test points. We present simulation and hardware experiments which show distinguishable characteristics between the transient waveforms of defective and non-defective devices. These variations are shown to exist for CMOS open drain and bridging defects, located both on and off of a sensitized path

Keywords

CMOS digital integrated circuits; automatic testing; integrated circuit measurement; integrated circuit testing; transient analysis; CMOS; I_DD switching transients; bridging defects; defective devices; digital integrated circuits; open drain defects; sensitized path; supply rails; test points; transient signal analysis; transient waveforms; voltage transients; CMOS digital integrated circuits; Circuit testing; Digital circuits; Digital integrated circuits; Integrated circuit testing; Rails; Signal analysis; Switching circuits; Transient analysis; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1996. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-3541-4

Type

conf

DOI

10.1109/TEST.1996.557062

Filename

557062