DocumentCode :
2047773
Title :
Complications in life prediction estimates at elevated temperatures in lead/tin solders during accelerated cycling
Author :
Tien, J.K. ; Attarwala, A.I.
Author_Institution :
Strategic Mater. R&D Lab., Texas Univ., Austin, TX, USA
fYear :
1991
fDate :
11-16 May 1991
Firstpage :
667
Lastpage :
670
Abstract :
It was reported previously that cyclically tested Pb/Sn solders of different compositions exhibited a complicating anelastic effect. The storage and recovery of anelastic strains suppress damaging creep strain from being stored, thus causing nonconservative life prediction estimates, and result in complications with respect to accelerated testing. These complications were at that time believed to be characteristic of only eutectic solders at near ambient temperatures. It is now found that these complications exist for high-end Pb solders and at higher temperatures. Experiments done on 90/10 Pb/Sn solder indicate that the anelastic strains are not due to an interaction between the lead and tin phases. This leads to the conclusion that grain morphology would play an important role in determining anelastic responses in solder. The effect of grain size on accelerated cycling is also discussed
Keywords :
lead alloys; life testing; soldering; tensile testing; tin alloys; PbSn solders; accelerated cycling; accelerated testing; anelastic effect; anelastic strains; grain morphology; grain size; life prediction estimates; Acceleration; Capacitive sensors; Creep; Grain size; Lead; Life estimation; Morphology; Temperature; Testing; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1991. Proceedings., 41st
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0012-2
Type :
conf
DOI :
10.1109/ECTC.1991.163951
Filename :
163951
Link To Document :
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