Title :
Improved common spatial pattern for brain-computer interfacing
Author :
Enzeng Dong ; Liting Li ; Chao Chen
Author_Institution :
Complex Syst. Control Theor. & Applic. Key Lab., Tianjin Univ. of Technol. (TJUT), Tianjin, China
Abstract :
Signal processing of electroencephalography (EEG) plays an important role in brain-computer-interface (BCI) system. It is crucial to select suitable features from EEG signals. This paper proposed a feature selection method which combing independent component analysis (ICA) and common spatial patterns (CSP) to improve the performances of classification. Firstly, EEG signals were filtered with 8-30HZ bandpass filter. Secondly, relative frequency band signals were decomposed into independent components to obtain the solution matrix by ICA, and then the EEG signals were reconstructed from the main components to improve the signal-to-noise ratios. CSP was used to extract the features of EEG signals. Finally, linear discriminate analysis classifier (LDA) and support vector machines (SVM) were used to classify the EEG feature signals. The experiment results showed that the average accuracy achieved by the proposed method were higher, compared common CSP method.
Keywords :
band-pass filters; brain-computer interfaces; electroencephalography; feature extraction; feature selection; independent component analysis; medical signal processing; signal classification; signal reconstruction; support vector machines; BCI system; CSP; EEG feature signals classification; EEG signal reconstruction; ICA; LDA; SVM; bandpass filter; brain-computer interfacing; brain-computer-interface system; common spatial pattern; electroencephalography; feature extraction; feature selection method; independent component analysis; linear discriminate analysis classifier; relative frequency band signal decomposition; signal processing; signal-to-noise ratios; solution matrix; support vector machines; Accuracy; Brain-computer interfaces; Electroencephalography; Feature extraction; Heart beat; Independent component analysis; Support vector machines; Common Spatial Patterns (CSP); Electroencephalography (EEG); Feature extraction pattern classification; Independent Component Analysis (ICA);
Conference_Titel :
Mechatronics and Automation (ICMA), 2015 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7097-1
DOI :
10.1109/ICMA.2015.7237812