Title :
Design methodology for IC manufacturability based on regular logic-bricks
Author :
Kheterpal, V. ; Rovner, V. ; Hersan, T.G. ; Motiani, D. ; Takegawa, Y. ; Strojwas, A.J. ; Pileggi, L.
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
Implementing logic blocks in an integrated circuit in terms of repeating or regular geometry patterns (Palusinski et al., 2001 and Strojwas, 2003) can provide significant advantages in terms of manufacturability and design cost (Pileggi et al., 2003). Various forms of gate and logic arrays have been recently proposed that can offer such pattern regularity to reduce design risk and costs. In this paper, we propose a full-mask-set design methodology which provides the same physical design coherence as a configurable array, but with area and other design benefits comparable to standard cell ASICs. This methodology is based on a set of simple logic primitives that are mapped to a set of logic bricks that are defined by a restrictive set of RET (resolution enhancement technique)-friendly geometry patterns. We propose a design methodology to explore trade-offs between the number of bricks and associated level of configurability versus the required silicon area. Results are shown to compare a design implemented with a small number of regular bricks to an implementation based on a full standard cell library in a 90nm CMOS technology.
Keywords :
CMOS logic circuits; design for manufacture; integrated circuit design; logic arrays; logic design; 90 nm; CMOS technology; RET-friendly geometry patterns; configurable array; full-mask-set design methodology; gate arrays; integrated circuit manufacturability; logic arrays; logic blocks; pattern regularity; regular logic-bricks; resolution enhancement technique; standard cell ASIC; standard cell library; CMOS technology; Computational geometry; Costs; Design methodology; Integrated circuit manufacture; Logic arrays; Logic circuits; Logic design; Logic gates; Manufacturing;
Conference_Titel :
Design Automation Conference, 2005. Proceedings. 42nd
Print_ISBN :
1-59593-058-2
DOI :
10.1109/DAC.2005.193833