Title :
Enhanced Accuracy Of 2D Finite Element Field Quantities By A Local Post-Process
Author :
Hameyer, K. ; Pahner, U. ; Belmans, R.
Author_Institution :
Katholieke Universiteit Leuven
Conference_Titel :
Computation in Electromagnetics, Third International Conference on (Conf. Publ. No. 420)
Conference_Location :
IET
Print_ISBN :
0-85296-657-1
