DocumentCode :
2047999
Title :
Correlating defects to functional and IDDQ tests
Author :
Powell, Theo J. ; Pair, James R. ; Carbajal, Bernard G., III
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fYear :
1996
fDate :
20-25 Oct 1996
Firstpage :
501
Lastpage :
510
Abstract :
Functional tests and IDDQ tests are studied to determine their effectiveness toward screening failures. A model is presented for curve fitting correlation data between fault coverages and defect quality employing the Williams and Brown defect level to fault coverage equation. The model is used for multiple test types. Empirical data were gathered to demonstrate its effectiveness over functional and IDDQ tests. IDDQ test data demonstrates two categories of IDDQ defects: pattern sensitive and pattern insensitive defects
Keywords :
CMOS digital integrated circuits; curve fitting; failure analysis; integrated circuit testing; quality control; CMOS digital ICs; IDDQ tests; QC; curve fitting correlation data; defect correlation; defect quality; failure screening; functional tests; multiple test types; pattern insensitive defects; pattern sensitive defects; Application specific integrated circuits; CMOS technology; Curve fitting; Equations; Fault detection; MOS devices; MOSFETs; Manufacturing; Semiconductor device modeling; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-3541-4
Type :
conf
DOI :
10.1109/TEST.1996.557075
Filename :
557075
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2047999
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