Distributed probabilistic diagnosis of MCMs on large area substrates

Author

Sasidhar, K. ; Chatterjee, A. ; Agarwal, V.E. ; Hughes, J.

Author_Institution

Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

fYear

1995

fDate

21-25 Oct 1995

Firstpage

208

Lastpage

216

Abstract

This paper addresses the issue of testing MCMs on large-area substrates. The cost of testing each MCM may be as high as 40% of the total manufacturing cost. It is critical that the test process be parallelized in order that multiple MCMs may be tested for the cost of testing one MCM. With this objective in mind, we propose a distributed probabilistic diagnosis algorithm for MCMs on large-area substrates. Our algorithm performs better than the existing diagnosis algorithms and can correctly identify almost all MCMs even when the yield is very low (35%). Further it provides upto an order of magnitude reduction in test application time as opposed to serial MCM probe test

Keywords

automatic test software; boundary scan testing; built-in self test; distributed algorithms; fault diagnosis; finite state machines; flip-flops; integrated circuit testing; logic testing; multichip modules; production testing; BIST; MCM testing; algorithm; boundary scan; distributed probabilistic diagnosis; finite state machine; flip-flops; large area substrates; modified comparison test; multiple MCMs; parallel testing and diagnosis algorithm; system level diagnosis; test vectors; testing costs; time reduction; Assembly; Costs; Electronic equipment testing; Electronics packaging; Manufacturing; Performance evaluation; Probes; Space technology; System testing; Wiring;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1995. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-2992-9

Type

conf

DOI

10.1109/TEST.1995.529835

Filename

529835