Title :
pH sensing characteristics of silicon nitride thin film and silicon nitride-based ISFET sensor
Author :
Yusof, Khairul Aimi ; Noh, Nurul Izzati Mohammad ; Herman, Sukreen Hana ; Abdullah, Ali Zaini ; Zolkapli, Maizatul ; Abdullah, Wan Fazlida Hanim
Author_Institution :
Fac. of Electr. Eng., Univ. Teknol. MARA (UiTM), Shah Alam, Malaysia
Abstract :
The pH sensing characterizations of silicon nitride (Si3N4) thin film, and Si3N4-based ISFET sensor were discussed in this paper. The Si3N4 thin film was fabricated with to form silicon/silicon dioxide/silicon nitride (Si/SiO2/Si3N4) structure while Si3N4-based ISFET was fabricated and packaged as a pH sensor. Both thin film and ISFET packaged device have low pressure chemical vapor deposited silicon nitride as sensing layer. Source measure unit (SMU), the semiconductor device analyzer model Agilent B1500A and a custom made test jig was used to investigate the electrical properties for both Si3N4 thin film and Si3N4-based ISFET sensor. The measurements were carrying out in three different buffer solutions with various pH levels of 4, 7 and 10 at room temperature. The pH sensitivity of thin film and ISFET packaged device with silicon nitride were 66.9 mV/pH and 53.6 mV/pH respectively. Both have shown good linearity in chosen pH range.
Keywords :
CVD coatings; chemical sensors; ion sensitive field effect transistors; pH measurement; silicon compounds; thin films; Si-SiO2-Si3N4; Source measure unit; buffer solutions; custom made test jig; electrical properties; low pressure chemical vapor deposited silicon nitride; pH sensing characteristics; pH sensitivity; semiconductor device analyzer model Agilent B1500A; silicon nitride thin film; silicon nitride-based ISFET sensor; temperature 293 K to 298 K; Capacitance-voltage characteristics; Current measurement; Semiconductor device measurement; Sensitivity; Sensors; Silicon; Temperature measurement; ISFET; Sensitivity; Silicon nitride;
Conference_Titel :
Control and System Graduate Research Colloquium (ICSGRC), 2013 IEEE 4th
Conference_Location :
Shah Alam
Print_ISBN :
978-1-4799-0550-8
DOI :
10.1109/ICSGRC.2013.6653290