• DocumentCode
    2048451
  • Title

    Development of Micro V-bending System for Investigation Grain Size Effect of Thin Metal Sheet

  • Author

    Jiang, Cho-Pei ; Chen, Chang-Cheng

  • Author_Institution
    Dept. of Power Mech. Eng., Nat. Formosa Univ., Huwei, Taiwan
  • Volume
    1
  • fYear
    2010
  • fDate
    19-21 March 2010
  • Firstpage
    276
  • Lastpage
    280
  • Abstract
    The aim of this study is to develop a micro V-bending testing system and to investigate the grain size effect of 99.5% Ferrum sheet plate in the micro V-bending process. In this study, two experiments have been conducted. They attempt to understand the characteristic of thickness variation at a constant average grain size of 29.93 ¿ m with a standard deviation (SD) of 2.4 and different average grain sizes at a constant mean thickness of 490.63 ¿ m with a SD of 11.3. A laser displacement sensor is employed to monitor the real position of punch movement and to verify the effective stroke. The T/D (thickness/average grain size) ratio is used to discuss material behavior such as punch force, spring-back and spring-forward in the micro V-bending test. According to the results, the conventional concept of V-bending deformation cannot be applied to different average grain sizes at a constant thickness in the micro V-bending test; in particular, if the T/D ratio is less than 2.
  • Keywords
    bending; elasticity; forming processes; mechanical testing; sensors; sheet metal processing; V-bending deformation; V-bending test; ferrum sheet plate; grain size effect; laser displacement sensor; metal forming process; micro V-bending process; micro V-bending system development; spring-back; spring-forward; standard deviation; thin metal sheet; Application software; Computer applications; Force measurement; Grain size; Mechanical engineering; Power engineering and energy; Power engineering computing; Sheet materials; System testing; Tensile stress; grain size effect; v-bending;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Engineering and Applications (ICCEA), 2010 Second International Conference on
  • Conference_Location
    Bali Island
  • Print_ISBN
    978-1-4244-6079-3
  • Electronic_ISBN
    978-1-4244-6080-9
  • Type

    conf

  • DOI
    10.1109/ICCEA.2010.62
  • Filename
    5445824