• DocumentCode
    2048590
  • Title

    Electromagnetic compatibility test system

  • Author

    Domingo-Perez, F. ; Flores-Arias, J.M. ; Moreno-Munoz, A. ; De la Rosa, J.J.G. ; Gil-de-Castro, Aurora ; Pallares-Lopez, V. ; Moreno-Garcia, I.

  • Author_Institution
    Dept. A.C., Electron. y T.E., Univ. de Cordoba, Cordoba, Spain
  • fYear
    2011
  • fDate
    1-3 June 2011
  • Firstpage
    62
  • Lastpage
    67
  • Abstract
    Voltage dips analysis is a complex stochastic issue, since it involves a large variety of random factors, such as: type of short circuits in the power system, location of faults, protective system performance and atmospheric discharges. Among all categories of electrical disturbances, the voltage dips (sags) and momentary interruptions are the nemeses of the automated industrial process. On the other hand, harmonic distortion is a steady state disturbance which is caused by the rectifier employed in adjustable speed drives, uninterruptible power supplies, electronic ballasts and other widely used energy-efficient technology. This paper describes a system for voltage dips testing according to IEC 61000-4-11 norm and it also test the supply current harmonic distortion according to the limits given in IEC 61000-3-2. The system equipment is described also with the test process. We use the created system to test the dip immunity of different topologies of PWM rectifiers and propose a new method of representing the results using power acceptability curves. The harmonic distortion is represented in a bar chart compared with the IEC 61000-3-2 limits.
  • Keywords
    electromagnetic compatibility; electronic equipment testing; harmonic distortion; lamp accessories; power supply quality; uninterruptible power supplies; variable speed drives; adjustable speed drives; complex stochastic issue; electromagnetic compatibility test system; electronic ballasts; harmonic distortion; momentary interruptions; uninterruptible power supplies; voltage dips analysis; Generators; Harmonic analysis; IEC standards; Software; Testing; Voltage fluctuations; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compatibility and Power Electronics (CPE), 2011 7th International Conference-Workshop
  • Conference_Location
    Tallinn
  • Print_ISBN
    978-1-4244-8806-3
  • Electronic_ISBN
    978-1-4244-8805-6
  • Type

    conf

  • DOI
    10.1109/CPE.2011.5942208
  • Filename
    5942208