DocumentCode
2048783
Title
Test SPC: a process to improve test system integrity
Author
Benitez, Willie ; Marrero, Deo ; Mirizzi, D. ; Ohmart, Dale
Author_Institution
Semicond. Div., Texas Instrum., USA
fYear
1995
fDate
21-25 Oct 1995
Firstpage
224
Lastpage
232
Abstract
A proposal to improve and control the final test of integrated circuits is presented. The objective is to improve the productivity of VLSI equipment by using a statistical process to reduce downtime and eliminate test escapes. Goals, developments, and implementation of this process are reviewed
Keywords
VLSI; automatic test equipment; automatic test software; human resource management; integrated circuit testing; production testing; quality control; statistical process control; ATE system; DUT interface; MiniDiag program; Test SPC; VLSI equipment; average quality level; downtime reduction; final test control; implementation; integrated circuits; lot accept testflow; production environment; productivity; sampling plan; test program; test system integrity; Circuit testing; Instruments; Integrated circuit testing; Marine vehicles; Monitoring; Production; Sampling methods; System testing; Temperature; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1995. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2992-9
Type
conf
DOI
10.1109/TEST.1995.529837
Filename
529837
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