Title :
Test SPC: a process to improve test system integrity
Author :
Benitez, Willie ; Marrero, Deo ; Mirizzi, D. ; Ohmart, Dale
Author_Institution :
Semicond. Div., Texas Instrum., USA
Abstract :
A proposal to improve and control the final test of integrated circuits is presented. The objective is to improve the productivity of VLSI equipment by using a statistical process to reduce downtime and eliminate test escapes. Goals, developments, and implementation of this process are reviewed
Keywords :
VLSI; automatic test equipment; automatic test software; human resource management; integrated circuit testing; production testing; quality control; statistical process control; ATE system; DUT interface; MiniDiag program; Test SPC; VLSI equipment; average quality level; downtime reduction; final test control; implementation; integrated circuits; lot accept testflow; production environment; productivity; sampling plan; test program; test system integrity; Circuit testing; Instruments; Integrated circuit testing; Marine vehicles; Monitoring; Production; Sampling methods; System testing; Temperature; Test equipment;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529837
