Partial scan flip flop selection for simulation-based sequential ATPGs

The partial scan approach is now widely adopted and several commercial tools support this technique. However, there is no general agreement on how to select the scan flip flops, in general each technique is tailored to a particular ATPG algorithm and results effective when coupled with the right ATPG tool. In this paper, we propose an approach suitable for GA-based ATPGs, which is barred on exploiting some information coming from the ATPG itself we compare the results of our method with the ones of the approach based on cutting the topological loops and use a GA-based ATPG to demonstrate its effectiveness in terms of fault coverage and CPU time