DocumentCode
2049403
Title
Standard test interface language (STIL) a new language for patterns and waveforms
Author
Taylor, Tony ; Maston, Gregory A.
Author_Institution
Credence Syst. Corp., Fremont, CA, USA
fYear
1996
fDate
20-25 Oct 1996
Firstpage
565
Lastpage
570
Abstract
This paper presents the major features and capabilities of the new standard test interface language (STIL). A synopsis of the language, typical applications of the language, work that has been done to date, and degree of acceptance by the industry are discussed
Keywords
automatic test software; computational complexity; digital integrated circuits; high level languages; integrated circuit testing; measurement standards; timing; waveform analysis; STIL; acceptance; data volume minimisation; digital integrated circuits; industry; patterns; standard test interface language; waveforms; Circuit simulation; Circuit testing; Design optimization; Digital integrated circuits; Discrete event simulation; Electronic mail; Hardware; Integrated circuit testing; Meetings; Standards development;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1996. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-3541-4
Type
conf
DOI
10.1109/TEST.1996.557091
Filename
557091
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