LIMSoft: automated tool for design and test integration of analog circuits

Author

Hamida, Naim Ben ; Saab, Khaled ; Marche, David ; Kaminska, Bozena ; Quesnel, Guy

Author_Institution

OPMAX Inc., Montreal, Que., Canada

fYear

1996

fDate

20-25 Oct 1996

Firstpage

571

Lastpage

580

Abstract

Integrating design and test presents a good challenge in today´s analog circuit manufacturing process. Designs should be made according to the sensitivity of the output to all the components. Furthermore, sensitivity can be used to observe component deviation (soft faults) and hard faults from the output. This paper presents an automated sensitivity analysis tool, called LIMSoft, which offers the possibility of sensitivity computation and analysis in order to design fault-resistant circuits and generate test vectors for both soft and hard faults. Some applications for integrating test and design are also presented

Keywords

SPICE; analogue circuits; automatic test software; circuit CAD; circuit analysis computing; design for manufacture; design for testability; fault diagnosis; integrated circuit testing; integrated circuit yield; sensitivity analysis; LIMSoft; Monte Carlo simulation; SPICE; analog circuits; automated sensitivity analysis tool; automated tool; component deviation; design test integration; fault dictionary generator; fault simulation; fault-resistant circuits; hard faults; manufacturing process; mismatch analysis; sensitivity computation; soft faults; test vectors; yield estimation; Analog circuits; Analog integrated circuits; Automatic testing; Circuit analysis computing; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Manufacturing processes; Process design;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1996. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-3541-4

Type

conf

DOI

10.1109/TEST.1996.557094

Filename

557094