DocumentCode :
2049689
Title :
Fabrication tolerance study on mode-coupling-based polarization rotators
Author :
Bing Liu ; Ping Shum ; Jing Zhang ; Guo-Qiang Lo
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2010
fDate :
17-19 Nov. 2010
Firstpage :
681
Lastpage :
684
Abstract :
In this paper, fabrication tolerance of two mode-coupling-based polarization rotators, slanted-angle polarization rotator and asymmetric sidewall polarization rotator, is studied and compared based on BPM and three-dimensional FDTD simulations. Optimization on both structures has achieved over 20 dB polarization extinction ratio with short rotation length. The effects of variation on rotation length, waveguide width, etched depth and width during fabrication are reported.
Keywords :
finite difference time-domain analysis; light polarisation; optical waveguides; BPM; asymmetric sidewall polarization rotator; etched depth; fabrication tolerance study; mode coupling-based polarization rotators; polarization extinction ratio; rotation length; slanted-angle polarization rotator; three-dimensional FDTD simulations; waveguide width; Finite difference methods; Helium; Optical device fabrication; Optical waveguides; Optimized production technology; Silicon; Polarization rotator; extinction ratio; photonic device; silicon waveguide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communication Systems (ICCS), 2010 IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-7004-4
Type :
conf
DOI :
10.1109/ICCS.2010.5686486
Filename :
5686486
Link To Document :
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