Title :
Magnetization vector measurement by wideband high spatial resolution kerr microscope
Author :
Nagai, T. ; Sekiguchi, H. ; Ito, A.
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
fDate :
March 30 2003-April 3 2003
Abstract :
In this article, we describe an improvement in spatial resolution and a simple method for measuring the three components of a magnetization vector.
Keywords :
Kerr magneto-optical effect; magnetisation; magnetization vector measurement; wideband high spatial resolution kerr microscopy; Magnetic force microscopy; Magnetization; Silicon compounds; Spatial resolution; Surface waves; Wideband;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230595
