Title :
Noncontact atomic force microscopy imaging of antiferromagnetic NiO(001) surface using ferromagnetic Fe-coated Si tip
Author :
Hosoi, H. ; Sueoka, K. ; Mukasa, K.
Author_Institution :
Innovation Plaza Hokkaido, Japan Sci. & Technol. Corp., Sapporo, Japan
fDate :
March 30 2003-April 3 2003
Abstract :
In this article, we performed an NC-AFM imaging of an antiferromagnetic NiO(001) surface with a ferromagnetic Fe-coated Si tip in order to explore the possibility of detecting short-range magnetic interactions.
Keywords :
antiferromagnetic materials; atomic force microscopy; exchange interactions (electron); ferromagnetic materials; iron; magnetic moments; nickel compounds; silicon; AFM imaging; Fe-Si; NiO; antiferromagnetic NiO(001) surface; ferromagnetic Fe-coated Si tip; noncontact atomic force microscopy; short range magnetic interactions; Antiferromagnetic materials; Atomic force microscopy; Magnetic force microscopy;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230596
