Title :
Leakage efficient chip-level dual-Vdd assignment with time slack allocation for FPGA power reduction
Author :
Lin, Yan ; He, Lei
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
To reduce power, Vdd programmability has been proposed recently to select Vdd-level for interconnects and to power-gate unused interconnects. However, Vdd-level converters used in the Vdd-programmable method consume a large amount of leakage. In this paper, we develop chip-level dual-Vdd assignment algorithms to guarantee that no low-Vdd interconnect switch drives high-Vdd interconnect switches. This removes the need of Vdd-level converters and reduces interconnect leakage and interconnect device area by 91.78% and 25.48%, respectively. The assignment algorithms include power sensitivity based heuristics with implicit time slack allocation and a linear programming (LP) based method with explicit time slack allocation. Both first allocate time slack to interconnects with higher transition density and assign low-Vdd to them for more power reduction. Compared to the aforementioned Vdd-programmable method using Vdd-level converters, the LP based algorithm reduces interconnect power by 65.13% without performance loss for the MCNC benchmark circuits. Compared to the LP based algorithm, the sensitivity based heuristics can obtain slightly smaller power reduction but run 4× faster.
Keywords :
field programmable gate arrays; interconnections; linear programming; FPGA power reduction; LP algorithm; MCNC benchmark circuits; Vdd programmability; Vdd-level converters; Vdd-programmable method; chip-level dual-Vdd assignment algorithms; explicit time slack allocation; high-Vdd interconnect switch; implicit time slack allocation; interconnect device area; interconnect leakage; interconnect power; linear programming; low-Vdd interconnect switch; performance loss; power sensitivity heuristics; power-gate; transition density; Field programmable gate arrays; Helium; Integrated circuit interconnections; Integrated circuit modeling; Logic; Performance loss; Permission; Routing; Switches; Wire;
Conference_Titel :
Design Automation Conference, 2005. Proceedings. 42nd
Print_ISBN :
1-59593-058-2
DOI :
10.1109/DAC.2005.193906