Title :
A scalable SCR compact model for ESD circuit simulation
Author :
Sarro, James Di ; Rosenbaum, Elyse
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL
fDate :
April 27 2008-May 1 2008
Abstract :
A scalable, compact model for SCR-based ESD-protection devices, which can simulate transient voltage overshoots observed on the timescale of charged device model (CDM) events, is presented. This model captures the effect that layout spacings have on SCR characteristics such as holding voltage and trigger current. Bias and time dependencies of SCR on-resistance are captured with a resistance model that accounts for self-heating and velocity saturation.
Keywords :
electrostatic discharge; thyristors; transients; ESD circuit simulation; ESD-protection devices; Si; charged device model; layout spacings; resistance model; scalable SCR compact model; self-heating; silicon controlled rectifier; transient voltage overshoots; trigger current; velocity saturation; Circuit simulation; Computational modeling; Discrete event simulation; Electrostatic discharge; P-i-n diodes; Protection; Resistors; Thyristors; Trigger circuits; Voltage control; Electrostatic discharge (ESD); compact modeling; silicon controller rectifier (SCR);
Conference_Titel :
Reliability Physics Symposium, 2008. IRPS 2008. IEEE International
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-2049-0
Electronic_ISBN :
978-1-4244-2050-6
DOI :
10.1109/RELPHY.2008.4558895
