Title :
Variation-tolerant circuits: circuit solutions and techniques
Author :
Tschanz, Jim ; Bowman, Keith ; De, Vivek
Author_Institution :
Circuit Res. Lab, Intel Corp., Hillsboro, OR, USA
Abstract :
Die-to-die and within-die variations impact the frequency and power of fabricated dies, affecting functionality, performance, and revenue. Variation-tolerant circuits and post-silicon tuning techniques are important for minimizing the impacts of these variations. This paper describes several circuit techniques that can be employed to ensure efficient circuit operation in the presence of ever-increasing variations.
Keywords :
integrated circuit design; body bias; circuit solutions; circuit techniques; die-to-die variations; parameter variation; post-silicon tuning techniques; variation-tolerant circuits; within-die variations; Circuit optimization; Clocks; Delay; Energy consumption; Fluctuations; Frequency; Logic arrays; Microprocessors; Temperature; Voltage;
Conference_Titel :
Design Automation Conference, 2005. Proceedings. 42nd
Print_ISBN :
1-59593-058-2
DOI :
10.1109/DAC.2005.193915