Low-complexity fault simulation under the multiple observation time testing approach

The use of three-value logic for fault simulation of synchronous sequential circuits may incur a loss of accuracy that would cause the fault coverage to be underestimated. In addition, loss of fault coverage may occur due to the test strategy employed. These problems were previously alleviated at the cost of high computational complexity. We present an observation that allows us to alleviate loss of fault coverage in many cases, at a computational cost similar to conventional three-value fault simulation. The proposed simulation procedure is compared to a previously proposed one to demonstrate its effectiveness